All oxide transparent MISFET using high-k dielectrics gates

Microelectronic Engineering 2004 Vol. 72; Iss. 1-4

All oxide transparent MISFET using high-k dielectrics gates

Kenji Nomura, Hiromichi Ohta, Kazushige Ueda, Toshio Kamiya, Masahiro Hirano, Hideo Hosono
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
72
Year:
2004
Language:
english
Pages:
5
DOI:
10.1016/j.mee.2004.01.007
File:
PDF, 271 KB
english, 2004
Conversion to is in progress
Conversion to is failed