Device architecture and reliability aspects of a novel 1.22...

Device architecture and reliability aspects of a novel 1.22 μm2 EEPROM cell in 0.18 μm node for embedded applications

G Tao, A Scarpa, K van Dijk, L van Marwijk, D Dormans, J Garbe, D Boter, R Verhaar
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
72
Year:
2004
Language:
english
Pages:
6
DOI:
10.1016/j.mee.2004.01.024
File:
PDF, 232 KB
english, 2004
Conversion to is in progress
Conversion to is failed