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Device architecture and reliability aspects of a novel 1.22 μm2 EEPROM cell in 0.18 μm node for embedded applications
G Tao, A Scarpa, K van Dijk, L van Marwijk, D Dormans, J Garbe, D Boter, R VerhaarVolume:
72
Year:
2004
Language:
english
Pages:
6
DOI:
10.1016/j.mee.2004.01.024
File:
PDF, 232 KB
english, 2004