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Influence of the electron mean free path on the resistivity of thin metal films
W. Zhang, S.H. Brongersma, O. Richard, B. Brijs, R. Palmans, L. Froyen, K. MaexVolume:
76
Year:
2004
Language:
english
Pages:
7
DOI:
10.1016/j.mee.2004.07.041
File:
PDF, 343 KB
english, 2004