Recent developments on Flash memory reliability

Microelectronic Engineering 2005 Vol. 80; Iss. none

Recent developments on Flash memory reliability

D. Ielmini, A.S. Spinelli, A.L. Lacaita
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Volume:
80
Year:
2005
Language:
english
Pages:
8
DOI:
10.1016/j.mee.2005.04.085
File:
PDF, 648 KB
english, 2005
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