Analysis of interface states and series resistance of MIS...

Microelectronic Engineering 2008 Vol. 85; Iss. 1

Analysis of interface states and series resistance of MIS Schottky diodes using the current–voltage (I–V) characteristics

A. Tataroğlu, Ş. Altındal
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Volume:
85
Year:
2008
Language:
english
Pages:
5
DOI:
10.1016/j.mee.2007.05.043
File:
PDF, 172 KB
english, 2008
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