Capacitance–Voltage Measurement With Photon Probe to...

IEEE Electron Device Letters 2012 / 07 Vol. 33; Iss. 7

Capacitance–Voltage Measurement With Photon Probe to Quantify the Trap Density of States in Amorphous Thin-Film Transistors

Chang, Youn-Gyoung, Lee, Hee Sung, Choi, Kyunghee, Im, Seongil
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Volume:
33
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2012.2195632
Date:
July, 2012
File:
PDF, 449 KB
english, 2012
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