Program efficiency and high temperature retention of SiN/high-K based memories
E. Vianello, M. Bocquet, F. Driussi, L. Perniola, G. Molas, L. SelmiVolume:
86
Year:
2009
Language:
english
Pages:
4
DOI:
10.1016/j.mee.2009.03.023
File:
PDF, 547 KB
english, 2009