X-ray microbeam strain investigation on Cu–MEMS structures

X-ray microbeam strain investigation on Cu–MEMS structures

Olivier Perroud, Renaud Vayrette, Christian Rivero, Olivier Thomas, Jean-Sébastien Micha, Olivier Ulrich
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Volume:
87
Year:
2010
Language:
english
Pages:
4
DOI:
10.1016/j.mee.2009.05.030
File:
PDF, 449 KB
english, 2010
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