VM-Based Baseline Predictive Maintenance Scheme
Hsieh, Yao-Sheng, Cheng, Fan-Tien, Huang, Hsien-Cheng, Wang, Chung-Ren, Wang, Saint-Chi, Yang, Haw-ChingVolume:
26
Language:
english
Journal:
IEEE Transactions on Semiconductor Manufacturing
DOI:
10.1109/tsm.2012.2218837
Date:
February, 2013
File:
PDF, 11.74 MB
english, 2013