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Experimental and theoretical investigation of defects at (1 0 0) Si1−xGex/oxide interfaces
M. Houssa, G. Pourtois, M. Meuris, M.M. Heyns, V.V. Afanas’ev, A. StesmansVolume:
88
Year:
2011
Language:
english
Pages:
5
DOI:
10.1016/j.mee.2010.09.001
File:
PDF, 717 KB
english, 2011