TPA Laser and Heavy-Ion SEE Testing: Complementary...

IEEE Transactions on Nuclear Science 2009 / 12 Vol. 56; Iss. 6

TPA Laser and Heavy-Ion SEE Testing: Complementary Techniques for SDRAM Single-Event Evaluation

Ladbury, Ray L., Benedetto, Joe, McMorrow, Dale, Buchner, Stephen P., Label, Kenneth A., Berg, Melanie D., Kim, Hak S., Sanders, Anthony B., Friendlich, Mark R., Phan, Anthony
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Volume:
56
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2009.2033690
Date:
December, 2009
File:
PDF, 1.61 MB
english, 2009
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