Characterization of interface defects related to...

Characterization of interface defects related to negative-bias temperature instability in ultrathin plasma-nitrided SiON/Si〈1 0 0〉 systems

Shinji Fujieda, Yoshinao Miura, Motofumi Saitoh, Yuden Teraoka, Akitaka Yoshigoe
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
45
Year:
2005
Language:
english
Pages:
8
DOI:
10.1016/j.microrel.2004.02.017
File:
PDF, 333 KB
english, 2005
Conversion to is in progress
Conversion to is failed