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Volume 45; Issue 1
Main
Microelectronics Reliability
Volume 45; Issue 1
Microelectronics Reliability
Volume 45; Issue 1
1
Mechanism of nitrogen-enhanced negative bias temperature instability in pMOSFET
Shyue Seng Tan
,
Tu Pei Chen
,
Chew Hoe Ang
,
Lap Chan
Journal:
Microelectronics Reliability
Year:
2005
Language:
english
File:
PDF, 745 KB
Your tags:
english, 2005
2
Negative bias temperature instability on three oxide thicknesses (1.4/2.2/5.2 nm) with nitridation variations and deuteration
Terence B. Hook
,
Ronald Bolam
,
William Clark
,
Jay Burnham
,
Nivo Rovedo
,
Laura Schutz
Journal:
Microelectronics Reliability
Year:
2005
Language:
english
File:
PDF, 423 KB
Your tags:
english, 2005
3
Characterization of interface defects related to negative-bias temperature instability in ultrathin plasma-nitrided SiON/Si〈1 0 0〉 systems
Shinji Fujieda
,
Yoshinao Miura
,
Motofumi Saitoh
,
Yuden Teraoka
,
Akitaka Yoshigoe
Journal:
Microelectronics Reliability
Year:
2005
Language:
english
File:
PDF, 333 KB
Your tags:
english, 2005
4
Modelling negative bias temperature instabilities in advanced p-MOSFETs
M. Houssa
Journal:
Microelectronics Reliability
Year:
2005
Language:
english
File:
PDF, 755 KB
Your tags:
english, 2005
5
A comprehensive model of PMOS NBTI degradation
M.A. Alam
,
S. Mahapatra
Journal:
Microelectronics Reliability
Year:
2005
Language:
english
File:
PDF, 347 KB
Your tags:
english, 2005
6
The impact of PMOST bias-temperature degradation on logic circuit reliability performance
Yung-Huei Lee
,
Steve Jacobs
,
Stefan Stadler
,
Neal Mielke
,
Ramez Nachman
Journal:
Microelectronics Reliability
Year:
2005
Language:
english
File:
PDF, 566 KB
Your tags:
english, 2005
7
Analog IP blocks
Mile Stojcev
Journal:
Microelectronics Reliability
Year:
2005
Language:
english
File:
PDF, 211 KB
Your tags:
english, 2005
8
Editorial
Tomasz Brozek
Journal:
Microelectronics Reliability
Year:
2005
Language:
english
File:
PDF, 208 KB
Your tags:
english, 2005
9
Improving the yield and reliability of the bulk-silicon HV-CMOS by adding a P-well
Weifeng Sun
,
Longxing Shi
Journal:
Microelectronics Reliability
Year:
2005
Language:
english
File:
PDF, 412 KB
Your tags:
english, 2005
10
Impact of NBTI and HCI on PMOSFET threshold voltage drift
Prasad Chaparala
,
Douglas Brisbin
Journal:
Microelectronics Reliability
Year:
2005
Language:
english
File:
PDF, 376 KB
Your tags:
english, 2005
11
Effects of inhomogeneous negative bias temperature stress on p-channel MOSFETs of analog and RF circuits
Christian Schlünder
,
Ralf Brederlow
,
Benno Ankele
,
Wolfgang Gustin
,
Karl Goser
,
Roland Thewes
Journal:
Microelectronics Reliability
Year:
2005
Language:
english
File:
PDF, 347 KB
Your tags:
english, 2005
12
Degradation dynamics, recovery, and characterization of negative bias temperature instability
M. Ershov
,
S. Saxena
,
S. Minehane
,
P. Clifton
,
M. Redford
,
R. Lindley
,
H. Karbasi
,
S. Graves
,
S. Winters
Journal:
Microelectronics Reliability
Year:
2005
Language:
english
File:
PDF, 365 KB
Your tags:
english, 2005
13
Effect of microwave radiation on the properties of Ta2O5–Si microstructures
E. Atanassova
,
R.V. Konakova
,
V.F. Mitin
,
J. Koprinarova
,
O.S. Lytvym
,
O.B. Okhrimenko
,
V.V. Schinkarenko
,
D. Virovska
Journal:
Microelectronics Reliability
Year:
2005
Language:
english
File:
PDF, 511 KB
Your tags:
english, 2005
14
Test generation for technology-specific multi-faults based on detectable perturbations
Andrej Zemva
,
Baldomir Zajc
Journal:
Microelectronics Reliability
Year:
2005
Language:
english
File:
PDF, 397 KB
Your tags:
english, 2005
15
A thorough investigation of MOSFETs NBTI degradation
V. Huard
,
M. Denais
,
F. Perrier
,
N. Revil
,
C. Parthasarathy
,
A. Bravaix
,
E. Vincent
Journal:
Microelectronics Reliability
Year:
2005
Language:
english
File:
PDF, 600 KB
Your tags:
english, 2005
16
Determination of the dice forward I–V characteristics of a power diode from a packaged device and its applications
Cher Ming Tan
,
Zhenghao Gan
,
Wai Fung Ho
,
Sam Chen
,
Robert Liu
Journal:
Microelectronics Reliability
Year:
2005
Language:
english
File:
PDF, 410 KB
Your tags:
english, 2005
17
Nanoscale structural characteristics and electron field emission properties of transition metal–fullerene compound TiC60 films
J. Chen
,
J.B. Xu
,
K. Xue
,
J. An
,
N. Ke
,
W. Cao
,
H.B. Xia
,
J. Shi
,
D.C. Tian
Journal:
Microelectronics Reliability
Year:
2005
Language:
english
File:
PDF, 390 KB
Your tags:
english, 2005
18
Impact of negative bias temperature instability on digital circuit reliability
Vijay Reddy
,
Anand T. Krishnan
,
Andrew Marshall
,
John Rodriguez
,
Sreedhar Natarajan
,
Tim Rost
,
Srikanth Krishnan
Journal:
Microelectronics Reliability
Year:
2005
Language:
english
File:
PDF, 356 KB
Your tags:
english, 2005
19
Efficient parametric yield optimization of VLSI circuit by uniform design sampling method
Ming-e Jing
,
Yue Hao
,
Jin-feng Zhang
,
Pei-jun Ma
Journal:
Microelectronics Reliability
Year:
2005
Language:
english
File:
PDF, 623 KB
Your tags:
english, 2005
20
Layout-mixed-signal
Mile Stojcev
Journal:
Microelectronics Reliability
Year:
2005
Language:
english
File:
PDF, 212 KB
Your tags:
english, 2005
21
Effects of electrical stressing in power VDMOSFETs
N. Stojadinovic
,
I. Manic
,
V. Davidovic
,
D. Dankovic
,
S. Djoric-Veljkovic
,
S. Golubovic
,
S. Dimitrijev
Journal:
Microelectronics Reliability
Year:
2005
Language:
english
File:
PDF, 443 KB
Your tags:
english, 2005
22
Positive charge generation due to species of hydrogen during NBTI phenomenon in pMOSFETs with ultra-thin SiON gate dielectrics
Shimpei Tsujikawa
,
Jiro Yugami
Journal:
Microelectronics Reliability
Year:
2005
Language:
english
File:
PDF, 323 KB
Your tags:
english, 2005
23
Effect of substrate flexibility on solder joint reliability. Part II: finite element modeling
Y.C. Lin
,
X. Chen
,
Xingsheng Liu
,
Guo-Quan Lu
Journal:
Microelectronics Reliability
Year:
2005
Language:
english
File:
PDF, 658 KB
Your tags:
english, 2005
24
Single resistance controlled oscillator using unity gain cells
P.A. Martínez Martínez
,
B.M. Monge Sanz
Journal:
Microelectronics Reliability
Year:
2005
Language:
english
File:
PDF, 267 KB
Your tags:
english, 2005
25
A function-fit model for the hard breakdown I–V characteristics of ultra-thin oxides in MOS structures
E. Miranda
,
B. Brandala
Journal:
Microelectronics Reliability
Year:
2005
Language:
english
File:
PDF, 302 KB
Your tags:
english, 2005
26
Analog IP blocks
STOJCEV, M
Journal:
Microelectronics Reliability
Year:
2005
Language:
english
File:
PDF, 211 KB
Your tags:
english, 2005
27
Effect of substrate flexibility on solder joint reliability. Part II: finite element modeling
LIN, Y
,
CHEN, X
,
LIU, X
,
LU, G
Journal:
Microelectronics Reliability
Year:
2005
Language:
english
File:
PDF, 658 KB
Your tags:
english, 2005
28
Layout-mixed-signal
STOJCEV, M
Journal:
Microelectronics Reliability
Year:
2005
Language:
english
File:
PDF, 212 KB
Your tags:
english, 2005
29
10.1016/s0026-2714(04)00208-2
BROZEK, T
Journal:
Microelectronics Reliability
Year:
2005
Language:
english
File:
PDF, 208 KB
Your tags:
english, 2005
30
Improving the yield and reliability of the bulk-silicon HV-CMOS by adding a P-well
SUN, W
,
SHI, L
Journal:
Microelectronics Reliability
Year:
2005
Language:
english
File:
PDF, 412 KB
Your tags:
english, 2005
31
Single resistance controlled oscillator using unity gain cells
MARTINEZ, P
,
SANZ, B
Journal:
Microelectronics Reliability
Year:
2005
Language:
english
File:
PDF, 267 KB
Your tags:
english, 2005
32
A function-fit model for the hard breakdown I–V characteristics of ultra-thin oxides in MOS structures
MIRANDA, E
,
BRANDALA, B
Journal:
Microelectronics Reliability
Year:
2005
Language:
english
File:
PDF, 302 KB
Your tags:
english, 2005
33
Effects of electrical stressing in power VDMOSFETs☆
STOJADINOVIC, N
,
MANIC, I
,
DAVIDOVIC, V
,
DANKOVIC, D
,
DJORICVELJKOVIC, S
,
GOLUBOVIC, S
,
DIMITRIJEV, S
Journal:
Microelectronics Reliability
Year:
2005
Language:
english
File:
PDF, 443 KB
Your tags:
english, 2005
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