Degradation of AlGaN/GaN HEMTs under elevated temperature...

Microelectronics Reliability 2004 Vol. 44; Iss. 7

Degradation of AlGaN/GaN HEMTs under elevated temperature lifetesting

Y.C Chou, D Leung, I Smorchkova, M Wojtowicz, R Grundbacher, L Callejo, Q Kan, R Lai, P.H Liu, D Eng, A Oki
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
44
Year:
2004
Language:
english
Pages:
6
DOI:
10.1016/j.microrel.2004.03.008
File:
PDF, 429 KB
english, 2004
Conversion to is in progress
Conversion to is failed