Volume 44; Issue 7

Microelectronics Reliability

Volume 44; Issue 7

1

2-Step algorithm for automatic alignment in wafer dicing process

Hyong Tae Kim, Chang Seop Song, Hae Jeong Yang

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 690 KB

english, 2004

2

Low frequency noise characterization in 0.13 μm p-MOSFETs. Impact of scaled-down 0.25, 0.18 and 0.13 μm technologies on 1/f noise

M. Marin, Y. Akue Allogo, M. de Murcia, P. Llinares, J.C. Vildeuil

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 362 KB

english, 2004

3

A two-dimensional analytical subthreshold behavior model for short-channel AlGaAs/GaAs HFETs

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 352 KB

english, 2004

4

Staggered heat sinks with aerodynamic cooling fins

Octavio A Leon, Gilbert De Mey, Erik Dick, Jan Vierendeels

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 340 KB

english, 2004

5

Impact life prediction modeling of TFBGA packages under board level drop test

Tong Yan Tee, Hun Shen Ng, Chwee Teck Lim, Eric Pek, Zhaowei Zhong

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 487 KB

english, 2004

6

A high-linear wide-tunable CMOS transconductor for video frequency applications

Belén Calvo, Santiago Celma, Ma Teresa Sanz, Pedro A Martı́nez

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 433 KB

english, 2004

7

Editorial

Peter Ersland, Roberto Menozzi

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 201 KB

english, 2004

8

Degradation of AlGaN/GaN HEMTs under elevated temperature lifetesting

Y.C Chou, D Leung, I Smorchkova, M Wojtowicz, R Grundbacher, L Callejo, Q Kan, R Lai, P.H Liu, D Eng, A Oki

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 429 KB

english, 2004

9

Lifetime acceleration model for HAST tests of a pHEMT process

Peter Ersland, Hei-Ruey Jen, Xinxing Yang

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 542 KB

english, 2004

10

Cycling copper flip chip interconnects

William J Roesch, Suwanna Jittinorasett

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 479 KB

english, 2004

11

High-resolution transmission electron microscopy on aged InP HBTs

Bruce M Paine, Timothy J Perham, Stephen Thomas III

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 395 KB

english, 2004

12

Reliability enhancement of electronic packages by design of optimal parameters

Ashish Batra, Pradeep Ramachandran, Poornima Sathyanarayanan, Susan Lu, Hari Srihari

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 336 KB

english, 2004

13

Analytical investigation of dead space effect under near-breakdown conditions in GaInP/GaAs composite double heterojunction bipolar transistors

Y.L Goh, D.S Ong

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 274 KB

english, 2004

14

Design strategy of localized halo profile for achieving sub-50 nm bulk MOSFET

Chun-Hsing Shih, Yi-Min Chen, Chenhsin Lien

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 433 KB

english, 2004

15

Impact of device geometry and doping strategy on linearity and RF performance in Si/SiGe MODFETs

L Yang, A Asenov, J.R Watling, M Boriçi, J.R Barker, S Roy, K Elgaid, I Thayne, T Hackbarth

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 817 KB

english, 2004

16

Low frequency noise as a tool to study optocouplers with phototransistors

Milan M Jevtić

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 312 KB

english, 2004

17

Networks on Chip; Axel Jantsch, Hannu Tenhunen (Eds.). Kluwer Academic Publishers, Boston; 2003. Hardcover, pp. 303, plus VIII, euro 117. ISBN 1-4020-7392-5

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 214 KB

english, 2004

18

Memory architecture exploration for programmable embedded systems; Peter Grun, Nikil Dutt, Alexandru Nicolau. Kluwer Academic Publishers, Boston. 2003. Hardcover, pp. 128, plus XVII, 116 euro. ISBN 1-4020-7324-0.

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 209 KB

english, 2004

19

Temperature influence on energy losses in MOSFET capacitors

A Gołda, A Kos

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 346 KB

english, 2004

20

Role of carrier depletion effects and material properties in advanced microscale thermal modeling of N-GaInP–Si/p-GaAs–C heterojunction bipolar transistor (HBT) devices

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 833 KB

english, 2004

21

Vibration fatigue experiments of SMT solder joint

Hongfang Wang, Mei Zhao, Qiang Guo

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 1.14 MB

english, 2004

22

Long-term reliability of Ti–Pt–Au metallization system for Schottky contact and first-level metallization on SiC MESFET

A Sozza, C Dua, A Kerlain, C Brylinski, E Zanoni

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 392 KB

english, 2004

23

Study of swing potential on deep submicron on-chip interconnect

Qungang Ma, Yuejin Li, Yintang Yang

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 341 KB

english, 2004

24

10.1016/s0026-2714(04)00086-1

ERSLAND, P, MENOZZI, R

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 201 KB

english, 2004