Testing Static Random Access Memories: Defects, Fault...

Microelectronics Reliability 2005 Vol. 45; Iss. 5-6

Testing Static Random Access Memories: Defects, Fault Models and Test Patterns, Said Hamdioui, Kluwer Academic Publishers, Boston, 2004, Hardcover, pp. 221, plus XX, euro 109, ISBN 1-4020-7752-1

Mile Stojcev
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
45
Year:
2005
Language:
english
Pages:
2
DOI:
10.1016/j.microrel.2004.11.003
File:
PDF, 59 KB
english, 2005
Conversion to is in progress
Conversion to is failed