Evidence and modelling current dependence of defect generation probability and its impact on charge to breakdown
G. Ribes, S. Bruyère, M. Denais, D. Roy, G. GhibaudoVolume:
45
Year:
2005
Language:
english
Pages:
4
DOI:
10.1016/j.microrel.2004.11.035
File:
PDF, 185 KB
english, 2005