Evidence and modelling current dependence of defect...

Evidence and modelling current dependence of defect generation probability and its impact on charge to breakdown

G. Ribes, S. Bruyère, M. Denais, D. Roy, G. Ghibaudo
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
45
Year:
2005
Language:
english
Pages:
4
DOI:
10.1016/j.microrel.2004.11.035
File:
PDF, 185 KB
english, 2005
Conversion to is in progress
Conversion to is failed