Experimental and numerical investigations on delayed...

Microelectronics Reliability 2007 Vol. 47; Iss. 2-3

Experimental and numerical investigations on delayed short-circuit failure mode of single chip IGBT devices

Z. Khatir, S. Lefebvre, F. Saint-Eve
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Volume:
47
Year:
2007
Language:
english
Pages:
7
DOI:
10.1016/j.microrel.2006.05.004
File:
PDF, 1.03 MB
english, 2007
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