Failure analyses for debug and ramp-up of modern IC’s

Microelectronics Reliability 2006 Vol. 46; Iss. 9-11

Failure analyses for debug and ramp-up of modern IC’s

Christian Burmer, Siegfried Görlich
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Volume:
46
Year:
2006
Language:
english
Pages:
12
DOI:
10.1016/j.microrel.2006.07.024
File:
PDF, 4.24 MB
english, 2006
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