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Reduced temperature dependence of hot carrier degradation in deuterated nMOSFETs
C. Salm, A.J. Hof, F.G. Kuper, J. SchmitzVolume:
46
Year:
2006
Language:
english
Pages:
6
DOI:
10.1016/j.microrel.2006.08.004
File:
PDF, 637 KB
english, 2006