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Correlating gate sinking and electrical performance of pseudomorphic high electron mobility transistors
Ronen A. Berechman, Boris Revzin, Yoram ShapiraVolume:
47
Year:
2007
Language:
english
Pages:
6
DOI:
10.1016/j.microrel.2006.08.020
File:
PDF, 574 KB
english, 2007