Volume 47; Issue 8

Microelectronics Reliability

Volume 47; Issue 8

1

Richard Zurawski, editor. Embedded Systems Handbook, Hardcover, pp. 1112, plus XXXIV, $139,95, CRC Press, Taylor & Francis Group, Boca Raton, 2006, ISBN 0-8493-2824-1.

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 77 KB

english, 2007

2

Response spectra analysis for undamped structural systems subjected to half-sine impact acceleration pulses

Tsung-Yueh Tsai, Chang-Lin Yeh, Yi-Shao Lai, Rong-Sheng Chen

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 512 KB

english, 2007

3

Very wide current-regime operation of an InP/InGaAs tunneling emitter bipolar transistor (TEBT)

Shiou-Ying Cheng

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 196 KB

english, 2007

4

Chip-on-Board (CoB) technology for low temperature environments. Part I: Wire profile modeling in unencapsulated chips

K.K. Jinka, S. Ganesan, A. Dasgupta, S. Ling, A. Shapiro, D. Schatzel

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 617 KB

english, 2007

5

Correlating gate sinking and electrical performance of pseudomorphic high electron mobility transistors

Ronen A. Berechman, Boris Revzin, Yoram Shapira

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 574 KB

english, 2007

6

Influence of thermal contact resistance on thermal impedance of microelectronic structures

B. Vermeersch, G. De Mey

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 423 KB

english, 2007

7

Electromigration of Sn–37Pb and Sn–3Ag–1.5Cu/Sn–3Ag–0.5Cu composite flip–chip solder bumps with Ti/Ni(V)/Cu under bump metallurgy

Yi-Shao Lai, Kuo-Ming Chen, Chin-Li Kao, Chiu-Wen Lee, Ying-Ta Chiu

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 1.78 MB

english, 2007

8

Correlation between localized strain and damage in shear-loaded Pb-free solders

M.A. Matin, J.G.A. Theeven, W.P. Vellinga, M.G.D. Geers

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 2.74 MB

english, 2007

9

Characterisation and passivation of interface defects in (1 0 0)-Si/SiO2/HfO2/TiN gate stacks

P.K. Hurley, K. Cherkaoui, S. McDonnell, G. Hughes, A.W. Groenland

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 303 KB

english, 2007

10

Switching times variation of power MOSFET devices after electrical stress

R. Habchi, C. Salame, P. Mialhe, A. Khoury

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 423 KB

english, 2007

11

Effect of oval defects in GaAs on the reliability of SiNx metal–insulator–metal capacitors

P.J. van der Wel, J.R. de Beer, R.J.M. van Boxtel, Y.Y. Hsieh, Y.C. Wang

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 620 KB

english, 2007

12

Reliability and performance of a true enhancement mode HIGFET for wireless applications

Craig Gaw, Thomas Arnold, Elizabeth Glass, Robert Martin

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 1.01 MB

english, 2007

13

S. Sitharama Iyengar, Richards R. Brooks, Eds., Distributed Sensor Networks, Hardcover, pp. 1123, plus XVI, Chapman & Hall/CRC Press, Boca Raton, 2005, ISBN 1-58488-383-9

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 79 KB

english, 2007

14

Cohesive zone modeling for structural integrity analysis of IC interconnects

B.A.E. van Hal, R.H.J. Peerlings, M.G.D. Geers, O. van der Sluis

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 787 KB

english, 2007

15

On the failure path in shear-tested solder joints

W.H. Moy, Y.-L. Shen

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 1.82 MB

english, 2007

16

Determination of transistor infant failure probability in InGaP/GaAs heterojunction bipolar technology

K.W. Alt, R.E. Yeats, C.P. Hutchinson, D.K. Kuhn, T.S. Low, M. Iwamoto, M.E. Adamski, R.L. Shimon, T.E. Shirley, M. Bonse, F.G. Kellert, D.C. D’Avanzo

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 431 KB

english, 2007

17

Editorial

Peter Ersland, Roberto Menozzi

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 74 KB

english, 2007

18

Comparison between BSIM4.X and HSPICE flicker noise models in NMOS and PMOS transistors in all operating regions

T. Noulis, S. Siskos, G. Sarrabayrouse

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 1.43 MB

english, 2007

19

A symbolic approach to design centering of analog circuits

Francesco Grasso, Stefano Manetti, Maria Cristina Piccirilli

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 281 KB

english, 2007

20

Low frequency noise and technology induced mechanical stress in MOSFETs

Paolo Fantini, Giorgio Ferrari

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 193 KB

english, 2007

21

First-principles study of the effects of oxygen vacancy on hole tunneling current

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 223 KB

english, 2007

22

Studies on solder bump electromigration in Cu/Sn–3Ag–0.5Cu/Cu system

Kimihiro Yamanaka, Yutaka Tsukada, Katsuaki Suganuma

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 1.06 MB

english, 2007

23

Field returns, a source of natural failure mechanisms

William J. Roesch, Steve Brockett

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 369 KB

english, 2007

24

Defining the safe operating area for HBTs with an InGaP emitter across temperature and current density

Charles S. Whitman

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 303 KB

english, 2007

25

Improved low frequency noise characteristics of sub-micron MOSFETs with TaSiN/TiN gate on ALD HfO2 dielectric

Siva Prasad Devireddy, Bigang Min, Zeynep Çelik-Butler, Hsing-Huang Tseng, Philip J. Tobin, Ania Zlotnicka

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 178 KB

english, 2007

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