Switching times variation of power MOSFET devices after...

Switching times variation of power MOSFET devices after electrical stress

R. Habchi, C. Salame, P. Mialhe, A. Khoury
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Volume:
47
Year:
2007
Language:
english
Pages:
4
DOI:
10.1016/j.microrel.2006.09.044
File:
PDF, 423 KB
english, 2007
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