Optimization and performance of Al2O3/GaN...

Microelectronics Reliability 2007 Vol. 47; Iss. 4-5

Optimization and performance of Al2O3/GaN metal–oxide–semiconductor structures

K. Čičo, J. Kuzmík, D. Gregušová, R. Stoklas, T. Lalinský, A. Georgakilas, D. Pogany, K. Fröhlich
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Volume:
47
Year:
2007
Language:
english
Pages:
4
DOI:
10.1016/j.microrel.2007.01.010
File:
PDF, 251 KB
english, 2007
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