Electrical stress effect on RF power characteristics of...

Microelectronics Reliability 2008 Vol. 48; Iss. 2

Electrical stress effect on RF power characteristics of SiGe hetero-junction bipolar transistors

Sheng-Yi Huang, Kun-Ming Chen, Guo-Wei Huang, Cheng-Chou Hung, Wen-Shiang Liao, Chun-Yen Chang
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Volume:
48
Year:
2008
Language:
english
Pages:
7
DOI:
10.1016/j.microrel.2007.05.008
File:
PDF, 997 KB
english, 2008
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