Compact modeling of the non-linear post-breakdown current in thin gate oxides using the generalized diode equation
Miranda, E.Volume:
48
Language:
english
Pages:
4
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2008.06.007
Date:
August, 2008
File:
PDF, 486 KB
english, 2008