PLL soft functional failure analysis in advanced logic...

Microelectronics Reliability 2008 / 8 Vol. 48; Iss. 8-9

PLL soft functional failure analysis in advanced logic product using fault based analogue simulation and soft defect localization

Gao, Liming, Burmer, Christian
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Volume:
48
Language:
english
Pages:
5
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2008.06.012
Date:
August, 2008
File:
PDF, 1.08 MB
english, 2008
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