Advanced thermal failure analysis and reliability...

Microelectronics Reliability 2008 / 8 Vol. 48; Iss. 8-9

Advanced thermal failure analysis and reliability investigations – Industrial demands and related limitations

Altes, Andreas, Tilgner, Rainer, Reissner, Markus, Steckert, Grazyna, Neumann, Gerald
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Volume:
48
Language:
english
Pages:
6
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2008.06.020
Date:
August, 2008
File:
PDF, 1.33 MB
english, 2008
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