Comparison between changes of ultracapacitors model...

Microelectronics Reliability 2008 / 8 Vol. 48; Iss. 8-9

Comparison between changes of ultracapacitors model parameters during calendar life and power cycling ageing tests

El Brouji, H., Briat, O., Vinassa, J.-M., Bertrand, N., Woirgard, E.
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Volume:
48
Language:
english
Pages:
6
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2008.07.022
Date:
August, 2008
File:
PDF, 231 KB
english, 2008
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