IGBT modules robustness during turn-off commutation
Busatto, G., Abbate, C., Abbate, B., Iannuzzo, F.Volume:
48
Language:
english
Pages:
5
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2008.07.027
Date:
August, 2008
File:
PDF, 1017 KB
english, 2008