Thermal heating within SOI
Koning, J.J., Lecaudey, S., Spaan, E., Stoutjesdijk, M., Janssen, J.H.J.Volume:
48
Language:
english
Pages:
4
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2008.07.057
Date:
August, 2008
File:
PDF, 620 KB
english, 2008