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The degradation mechanisms in high voltage pLEDMOS transistor with thick gate oxide
Hong Wu, Weifeng Sun, Yangbo Yi, Haisong Li, Longxing ShiVolume:
48
Year:
2008
Language:
english
Pages:
5
DOI:
10.1016/j.microrel.2008.09.002
File:
PDF, 234 KB
english, 2008