Volume 48; Issue 11-12

Microelectronics Reliability

Volume 48; Issue 11-12
1

Model for life prediction of fatigue–creep interaction

R. Valentín, Donald Barker, Michael Osterman
Journal:
Microelectronics Reliability
Year:
2008
Language:
english
File:
PDF, 576 KB
english, 2008
7

An automated approach for locating multiple faulty LUTs in an FPGA

T. Nandha Kumar, Chia Wai Chong
Journal:
Microelectronics Reliability
Year:
2008
Language:
english
File:
PDF, 589 KB
english, 2008
11

A fast mechanical test technique for life time estimation of micro-joints

G. Khatibi, W. Wroczewski, B. Weiss, T. Licht
Journal:
Microelectronics Reliability
Year:
2008
Language:
english
File:
PDF, 1.02 MB
english, 2008
20

Calendar

Journal:
Microelectronics Reliability
Year:
2008
Language:
english
File:
PDF, 54 KB
english, 2008
22

Improved upper contacts PMMA on P3HT PTFTS using photolithographic processes

I. Mejia, M. Estrada, M. Avila
Journal:
Microelectronics Reliability
Year:
2008
Language:
english
File:
PDF, 370 KB
english, 2008
23

A review of board level solder joints for mobile applications

E.H. Wong, S.K.W. Seah, V.P.W. Shim
Journal:
Microelectronics Reliability
Year:
2008
Language:
english
File:
PDF, 1.19 MB
english, 2008
24

Self-testing of fully differential multistage circuits using common-mode excitation

Wojciech Toczek
Journal:
Microelectronics Reliability
Year:
2008
Language:
english
File:
PDF, 391 KB
english, 2008
25

Inside front cover - Editorial board

Journal:
Microelectronics Reliability
Year:
2008
Language:
english
File:
PDF, 41 KB
english, 2008