Employing vertical dielectric layers to improve the...

Microelectronics Reliability 2009 Vol. 49; Iss. 4

Employing vertical dielectric layers to improve the operation performance of flash memory devices

Chia-Huai Ho, Kuei-Shu Chang-Liao, Chun-Yuan Lu, Chun-Chang Lu, Tien-Ko Wang
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Volume:
49
Year:
2009
Language:
english
Pages:
6
DOI:
10.1016/j.microrel.2008.12.004
File:
PDF, 1.45 MB
english, 2009
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