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Volume 49; Issue 4
Main
Microelectronics Reliability
Volume 49; Issue 4
Microelectronics Reliability
Volume 49; Issue 4
1
Employing vertical dielectric layers to improve the operation performance of flash memory devices
Chia-Huai Ho
,
Kuei-Shu Chang-Liao
,
Chun-Yuan Lu
,
Chun-Chang Lu
,
Tien-Ko Wang
Journal:
Microelectronics Reliability
Year:
2009
Language:
english
File:
PDF, 1.45 MB
Your tags:
english, 2009
2
A CORDIC-based digital protective relay and its architecture
Jong Kang Park
,
Jong Tae Kim
,
Myong-Chul Shin
Journal:
Microelectronics Reliability
Year:
2009
Language:
english
File:
PDF, 893 KB
Your tags:
english, 2009
3
Soft error recovery in simplex and triplex memory systems
John Kontoleon
Journal:
Microelectronics Reliability
Year:
2009
Language:
english
File:
PDF, 984 KB
Your tags:
english, 2009
4
Mapping the failure envelope of board-level solder joints
L.B. Tan
,
Xiaowu Zhang
,
C.T. Lim
,
V.B.C. Tan
Journal:
Microelectronics Reliability
Year:
2009
Language:
english
File:
PDF, 1.86 MB
Your tags:
english, 2009
5
Study on the performance of sub 100 nm LACLATI MOSFETs for digital application
Partha Sarkar
,
Abhijit Mallik
,
Chandan Kumar Sarkar
Journal:
Microelectronics Reliability
Year:
2009
Language:
english
File:
PDF, 402 KB
Your tags:
english, 2009
6
Structure optimization of multi-finger power SiGe HBTs for thermal stability improvement
Dongyue Jin
,
Wanrong Zhang
,
Hongyun Xie
,
Liang Chen
,
Pei Shen
,
Ning Hu
Journal:
Microelectronics Reliability
Year:
2009
Language:
english
File:
PDF, 537 KB
Your tags:
english, 2009
7
Study of gate dielectric permittivity variation with different equivalent oxide thickness on channel engineered deep sub-micrometer n-MOSFET device for mixed signal applications
A. Srivastava
,
Partha Sarkar
,
Chandan Kumar Sarkar
Journal:
Microelectronics Reliability
Year:
2009
Language:
english
File:
PDF, 222 KB
Your tags:
english, 2009
8
Analytical analysis of nanoscale multiple gate MOSFETs including effects of hot-carrier induced interface charges
F. Djeffal
,
Z. Ghoggali
,
Z. Dibi
,
N. Lakhdar
Journal:
Microelectronics Reliability
Year:
2009
Language:
english
File:
PDF, 440 KB
Your tags:
english, 2009
9
Characteristics of metal-oxide-semiconductor (MOS) device with Er metal gate on SiO2 film
Chel-Jong Choi
,
Ha-Yong Yang
,
Hyo-Bong Hong
,
Jin-Gyu Kim
,
Sung-Yong Chang
,
Jouhahn Lee
Journal:
Microelectronics Reliability
Year:
2009
Language:
english
File:
PDF, 358 KB
Your tags:
english, 2009
10
Towards the use of the conformal-evaporated-film-by-rotation technique in fabricating microelectronic circuits and microsystems
R.J. Martín-Palma
,
C.G. Pantano
,
A. Lakhtakia
Journal:
Microelectronics Reliability
Year:
2009
Language:
english
File:
PDF, 335 KB
Your tags:
english, 2009
11
Subthreshold parameters of radio-frequency multi-finger nanometer MOS transistors
Sik-Lam Siu
,
Hei Wong
,
Wing-Shan Tam
,
K. Kakusima
,
H. Iwai
Journal:
Microelectronics Reliability
Year:
2009
Language:
english
File:
PDF, 542 KB
Your tags:
english, 2009
12
Emitter-metal-related degradation in InP-based HBTs operating at high current density and its suppression by refractory metal
Yoshino K. Fukai
,
Kenji Kurishima
,
Norihide Kashio
,
Minoru Ida
,
Shoji Yamahata
,
Takatomo Enoki
Journal:
Microelectronics Reliability
Year:
2009
Language:
english
File:
PDF, 769 KB
Your tags:
english, 2009
13
Non-linear average electrothermal models of buck and boost converters for SPICE
Krzysztof Górecki
Journal:
Microelectronics Reliability
Year:
2009
Language:
english
File:
PDF, 491 KB
Your tags:
english, 2009
14
Calendar
Journal:
Microelectronics Reliability
Year:
2009
Language:
english
File:
PDF, 58 KB
Your tags:
english, 2009
15
Electrothermal analysis of the self-excited push–pull DC–DC converter
Krzysztof Górecki
,
Janusz Zarębski
Journal:
Microelectronics Reliability
Year:
2009
Language:
english
File:
PDF, 641 KB
Your tags:
english, 2009
16
CDMA bus-based on-chip interconnect infrastructure
Tatjana Nikolic
,
Mile Stojcev
,
Goran Djordjevic
Journal:
Microelectronics Reliability
Year:
2009
Language:
english
File:
PDF, 1.13 MB
Your tags:
english, 2009
17
Inside front cover - Editorial board
Journal:
Microelectronics Reliability
Year:
2009
Language:
english
File:
PDF, 41 KB
Your tags:
english, 2009
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