Volume 49; Issue 4

Microelectronics Reliability

Volume 49; Issue 4

1

Employing vertical dielectric layers to improve the operation performance of flash memory devices

Chia-Huai Ho, Kuei-Shu Chang-Liao, Chun-Yuan Lu, Chun-Chang Lu, Tien-Ko Wang

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 1.45 MB

english, 2009

2

A CORDIC-based digital protective relay and its architecture

Jong Kang Park, Jong Tae Kim, Myong-Chul Shin

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 893 KB

english, 2009

3

Soft error recovery in simplex and triplex memory systems

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 984 KB

english, 2009

4

Mapping the failure envelope of board-level solder joints

L.B. Tan, Xiaowu Zhang, C.T. Lim, V.B.C. Tan

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 1.86 MB

english, 2009

5

Study on the performance of sub 100 nm LACLATI MOSFETs for digital application

Partha Sarkar, Abhijit Mallik, Chandan Kumar Sarkar

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 402 KB

english, 2009

6

Structure optimization of multi-finger power SiGe HBTs for thermal stability improvement

Dongyue Jin, Wanrong Zhang, Hongyun Xie, Liang Chen, Pei Shen, Ning Hu

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 537 KB

english, 2009

7

Study of gate dielectric permittivity variation with different equivalent oxide thickness on channel engineered deep sub-micrometer n-MOSFET device for mixed signal applications

A. Srivastava, Partha Sarkar, Chandan Kumar Sarkar

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 222 KB

english, 2009

8

Analytical analysis of nanoscale multiple gate MOSFETs including effects of hot-carrier induced interface charges

F. Djeffal, Z. Ghoggali, Z. Dibi, N. Lakhdar

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 440 KB

english, 2009

9

Characteristics of metal-oxide-semiconductor (MOS) device with Er metal gate on SiO2 film

Chel-Jong Choi, Ha-Yong Yang, Hyo-Bong Hong, Jin-Gyu Kim, Sung-Yong Chang, Jouhahn Lee

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 358 KB

english, 2009

10

Towards the use of the conformal-evaporated-film-by-rotation technique in fabricating microelectronic circuits and microsystems

R.J. Martín-Palma, C.G. Pantano, A. Lakhtakia

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 335 KB

english, 2009

11

Subthreshold parameters of radio-frequency multi-finger nanometer MOS transistors

Sik-Lam Siu, Hei Wong, Wing-Shan Tam, K. Kakusima, H. Iwai

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 542 KB

english, 2009

12

Emitter-metal-related degradation in InP-based HBTs operating at high current density and its suppression by refractory metal

Yoshino K. Fukai, Kenji Kurishima, Norihide Kashio, Minoru Ida, Shoji Yamahata, Takatomo Enoki

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 769 KB

english, 2009

13

Non-linear average electrothermal models of buck and boost converters for SPICE

Krzysztof Górecki

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 491 KB

english, 2009

14

Calendar

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 58 KB

english, 2009

15

Electrothermal analysis of the self-excited push–pull DC–DC converter

Krzysztof Górecki, Janusz Zarębski

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 641 KB

english, 2009

16

CDMA bus-based on-chip interconnect infrastructure

Tatjana Nikolic, Mile Stojcev, Goran Djordjevic

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 1.13 MB

english, 2009

17

Inside front cover - Editorial board

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 41 KB

english, 2009