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Defects in Microelectronic Materials and Devices, Daniel M. Fleetwood, Sokrates T. Pantelides, Ronald D. Schrimpf (Eds.). Taylor and Francis Group LLC, Boca Raton, FL, USA
Ahmed AminVolume:
49
Year:
2009
Language:
english
Pages:
2
DOI:
10.1016/j.microrel.2009.03.017
File:
PDF, 105 KB
english, 2009