Stress Effects on Self-Aligned Silicon Nanowire Junctionless Field-Effect Transistors
Huang, C. J., Yang, C. H., Hsueh, C. Y., Lee, J. H., Chang, Y. T., Lee, S. C.Volume:
32
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2011.2159772
Date:
September, 2011
File:
PDF, 522 KB
english, 2011