In Search of “Forever,” Continued Transistor Scaling One New Material at a Time
Thompson, S.E., Chau, R.S., Ghani, T., Mistry, K., Tyagi, S., Bohr, M.T.Volume:
18
Language:
english
Journal:
IEEE Transactions on Semiconductor Manufacturing
DOI:
10.1109/TSM.2004.841816
Date:
February, 2005
File:
PDF, 1.73 MB
english, 2005