Effect of Interface States on the Performance of Antimonide nMOSFETs
Ali, Ashkar, Madan, Himanshu, Barth, Michael J., Boos, J. Brad, Bennett, Brian R., Datta, SumanVolume:
34
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2012.2236881
Date:
March, 2013
File:
PDF, 752 KB
english, 2013