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Volume 34; Issue 3
Main
IEEE Electron Device Letters
Volume 34; Issue 3
IEEE Electron Device Letters
Volume 34; Issue 3
1
Resonant Magnetic Field Sensor With Capacitive Driving and Electromagnetic Induction Sensing
Wu, Guoqiang
,
Xu, Dehui
,
Xiong, Bin
,
Feng, Duan
,
Wang, Yuelin
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 363 KB
Your tags:
english, 2013
2
Graphene FETs for Zero-Bias Linear Resistive FET Mixers
Moon, J. S.
,
Seo, H.-C.
,
Antcliffe, M.
,
Le, D.
,
McGuire, C.
,
Schmitz, A.
,
Nyakiti, L. O.
,
Gaskill, D. K.
,
Campbell, P. M.
,
Lee, K.-M.
,
Asbeck, P.
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 385 KB
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english, 2013
3
Compact Models of Voltage Drops in Power Delivery Network for TSV-Based Three-Dimensional Integration
He, Huanyu
,
Lu, Jian-Qiang
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 500 KB
Your tags:
english, 2013
4
Simulation Study of Germanium p-Type Nanowire Schottky Barrier MOSFETs
Lee, Jaehyun
,
Shin, Mincheol
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 422 KB
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english, 2013
5
An Etch-Stop Barrier Structure for GaN High-Electron-Mobility Transistors
Bin Lu,
,
Min Sun,
,
Palacios, T.
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 635 KB
Your tags:
english, 2013
6
An 11%-Power-Conversion-Efficiency Organic–Inorganic Hybrid Solar Cell Achieved by Facile Organic Passivation
Liu, Dong
,
Zhang, Yunfang
,
Fang, Xiao
,
Zhang, Fute
,
Song, Tao
,
Sun, Baoquan
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 410 KB
Your tags:
english, 2013
7
Quaternary Barrier InAlGaN HEMTs With $f_{T}/f_{\max}$ of 230/300 GHz
Wang, Ronghua
,
Li, Guowang
,
Karbasian, Golnaz
,
Guo, Jia
,
Song, Bo
,
Yue, Yuanzheng
,
Hu, Zongyang
,
Laboutin, Oleg
,
Cao, Yu
,
Johnson, Wayne
,
Snider, Gregory
,
Fay, Patrick
,
Jena, Debdeep
,
Xing, Huili Grac
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 437 KB
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english, 2013
8
Reliable Operation of SiC JFET Subjected to Over 2.4 Million 1200-V/115-A Hard Switching Events at 150 $^{\circ}\hbox{C}$
Veliadis, V.
,
Steiner, B.
,
Lawson, K.
,
Bayne, S. B.
,
Urciuoli, D.
,
Ha, H. C.
,
El-Hinnawy, N.
,
Gupta, S.
,
Borodulin, P.
,
Howell, R. S.
,
Scozzie, C.
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 481 KB
Your tags:
english, 2013
9
1.4-kV AlGaN/GaN HEMTs on a GaN-on-SOI Platform
Jiang, Qimeng
,
Liu, Cheng
,
Lu, Yunyou
,
Chen, Kevin J.
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 537 KB
Your tags:
english, 2013
10
High Operating Temperature Midwave Infrared InAs/GaSb Superlattice Photodetectors on (111) GaSb Substrates
Plis, E.
,
Klein, B.
,
Myers, S.
,
Gautam, N.
,
Smith, E. P.
,
Krishna, S.
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 533 KB
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english, 2013
11
Heterojunction-Free GaN Nanochannel FinFETs With High Performance
Im, Ki-Sik
,
Jo, Young-Woo
,
Lee, Jae-Hoon
,
Cristoloveanu, Sorin
,
Lee, Jung-Hee
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 341 KB
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english, 2013
12
Schottky-barrier normally off GaN/InAlN/AlN/GaN HEMT with selectively etched access region
Jurkovic, M.
,
Gregusova, D.
,
Palankovski, V.
,
Hascik, Stefan
,
Blaho, M.
,
Cico, K.
,
Frohlich, K.
,
Carlin, J.
,
Grandjean, N.
,
Kuzmik, J.
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 329 KB
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english, 2013
13
A Study on the Sign Inversion Behavior of Organic Magnetoresistance
Zhang, Tianyou
,
Zhao, Junqing
,
Yan, Xingwu
,
Peng, Qiming
,
Fu, Gang
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 152 KB
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english, 2013
14
High-Voltage (600-V) Low-Leakage Low-Current-Collapse AlGaN/GaN HEMTs with AlN/SiNx Passivation
Tang, Zhikai
,
Huang, Sen
,
Jiang, Qimeng
,
Liu, Shenghou
,
Liu, Cheng
,
Chen, Kevin J.
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 615 KB
Your tags:
english, 2013
15
Modeling Erratic Bits Temperature Dependence for Monte Carlo Simulation of Flash Arrays
Zambelli, Cristian
,
Koebernik, Gert
,
Ullmann, Rudolf
,
Bauer, Matthias
,
Tempel, Georg
,
Olivo, Piero
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 136 KB
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english, 2013
16
A Novel Charge-Trapping-Type Memory With Gate-All-Around Poly-Si Nanowire and HfAlO Trapping Layer
Lee, Ko-Hui
,
Lin, Horng-Chih
,
Huang, Tiao-Yuan
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 656 KB
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english, 2013
17
High-Quality ICPCVD $\hbox{SiO}_{2}$ for Normally Off AlGaN/GaN-on-Si Recessed MOSHFETs
Park, Bong-Ryeol
,
Lee, Jae-Gil
,
Choi, Woojin
,
Kim, Hyungtak
,
Seo, Kwang-Seok
,
Cha, Ho-Young
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 364 KB
Your tags:
english, 2013
18
Improved Thermal Stability and Reduced Contact Resistance of Ohmic Contacts on N-Face n-Type GaN With Laser-Assisted Doping
Kim, Su Jin
,
Jeong, Tak
,
Kim, Tae Geun
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 335 KB
Your tags:
english, 2013
19
AlGaN-GaN Metal-Insulator-Semiconductor High-Electron-Mobility Transistors With Very High- $k$ Oxynitride $\hbox{TaO}_{x} \hbox{N}_{y}$ Gate Dielectric
Sato, Taku
,
Okayasu, Junich
,
Takikawa, Masahiko
,
Suzuki, Toshi-kazu
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 472 KB
Your tags:
english, 2013
20
Influence of Guard-Ring Structure on the Dark Count Rates of Silicon Photomultipliers
Sul, Woo-Suk
,
Lee, Chae-Hun
,
Cho, Gyu-Seong
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 531 KB
Your tags:
english, 2013
21
Experimental and Simulated Cycling of ISFET Electric Fields for Drift Reset
Welch, David
,
Shah, Sahil
,
Ozev, Sule
,
Blain Christen, Jennifer
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 286 KB
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english, 2013
22
New Subject Category on Emerging Technologies and Devices
Cressler, John D.
,
Chatterjee, Amitava
,
Jindal, Renuka
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 22 KB
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english, 2013
23
Fabrication of 340-GHz Folded Waveguides Using KMPR Photoresist
Li, Hanyan
,
Li, Yongtao
,
Feng, Jinjun
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 316 KB
Your tags:
english, 2013
24
Mechanism for Leakage Reduction by La Incorporation in a $\hbox{HfO}_{2}\hbox{/SiO}_{2}\hbox{/Si}$ Gate Stack
Manabe, Kenzo
,
Watanabe, Koji
,
Jagannathan, Hemanth
,
Paruchuri, Vamsi K.
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 115 KB
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english, 2013
25
Polarization-Induced Electric Fields Make Robust n-GaN/i-InGaN/p-GaN Solar Cells
Dickerson, Jeramy R.
,
Pantzas, Konstantinos
,
Ougazzaden, Abdallah
,
Voss, Paul L.
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 390 KB
Your tags:
english, 2013
26
Electron Trap Transformation Under Positive-Bias Temperature Stressing
Gao, Y.
,
Ang, D. S.
,
Bersuker, G.
,
Young, C. D.
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 325 KB
Your tags:
english, 2013
27
Effect of Interface States on the Performance of Antimonide nMOSFETs
Ali, Ashkar
,
Madan, Himanshu
,
Barth, Michael J.
,
Boos, J. Brad
,
Bennett, Brian R.
,
Datta, Suman
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 752 KB
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english, 2013
28
A New Millimeter-Wave Fixture Deembedding Method Based on Generalized Cascade Network Model
Loo, X. S.
,
Yeo, K. S.
,
Chew, K. W. J.
,
Chan, L. H. K.
,
Ong, S. N.
,
Do, M. A.
,
Boon, C. C.
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 323 KB
Your tags:
english, 2013
29
Corrections to “Demonstration of Addressable Organic Resistive Memory Utilizing a PC-Interface Memory Cell Tester” [Jan 13 51-53]
Cho, Byungjin
,
Song, Sunghoon
,
Ji, Yongsung
,
Choi, Ho-Gil
,
Ko, Heung Cho
,
Lee, Jae-Suk
,
Jung, Gun-Young
,
Lee, Takhee
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 27 KB
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english, 2013
30
An Empirical Model for RRAM Resistance in Low- and High-Resistance States
Puglisi, Francesco M.
,
Larcher, Luca
,
Bersuker, Gennadi
,
Padovani, Andrea
,
Pavan, Paolo
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 201 KB
Your tags:
english, 2013
31
Junction Engineering of 1T-DRAMs
Giusi, Gino
,
Iannaccone, Giuseppe
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 393 KB
Your tags:
english, 2013
32
Direct Impact of Chemical Bonding of Oxynitride on Boron Penetration and Electrical Oxide Hardening for Nanoscale Flash Memory
Kim, Taehoon
,
Koka, Sateesh
,
Surthi, Shyam
,
Zhuang, Kent
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 393 KB
Your tags:
english, 2013
33
$\hbox{GeO}_{2}$ Passivation for Low Surface Recombination Velocity on Ge Surface
Chen, Yen-Yu
,
Chang, H.-C.
,
Chi, Y.-H.
,
Huang, C.-H.
,
Liu, C. W.
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 485 KB
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english, 2013
34
Ultraviolet Detector Based on $\hbox{SrZr}_{0.1} \hbox{Ti}_{0.9}\hbox{O}_{3}$ Film
Zhang, Min
,
Chen, Yu
,
Zhang, Haifeng
,
Chen, Weiyou
,
Lv, Kaibo
,
Ruan, Shengping
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 314 KB
Your tags:
english, 2013
35
Air-Gap Through-Silicon Vias
Huang, Cui
,
Chen, Qianwen
,
Wang, Zheyao
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 478 KB
Your tags:
english, 2013
36
A Dual-Junction Single-Photon Avalanche Diode in 130-nm CMOS Technology
Henderson, Robert K.
,
Webster, Eric A. G.
,
Grant, Lindsay A.
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 495 KB
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english, 2013
37
Germanium–Tin (GeSn) p-Channel MOSFETs Fabricated on (100) and (111) Surface Orientations With Sub-400 $^{\circ}\hbox{C}\ \hbox{Si}_{2}\hbox{H}_{6}$ Passivation
Gong, Xiao
,
Han, Genquan
,
Bai, Fan
,
Su, Shaojian
,
Guo, Pengfei
,
Yang, Yue
,
Cheng, Ran
,
Zhang, Dongliang
,
Zhang, Guangze
,
Xue, Chunlai
,
Cheng, Buwen
,
Pan, Jisheng
,
Zhang, Zheng
,
Tok, Eng Soon
,
Antoniad
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 567 KB
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english, 2013
38
On the Bipolar Resistive Switching Memory Using $ \hbox{TiN/Hf/HfO}_{2}/\hbox{Si}$ MIS Structure
Wu, Yung-Hsien
,
Wouters, Dirk J
,
Hendrickx, Paul
,
Zhang, Leqi
,
Chen, Yang Yin
,
Goux, Ludovic
,
Fantini, Andrea
,
Groeseneken, Guido
,
Jurczak, Malgorzata
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 321 KB
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english, 2013
39
Analysis of Intrinsic Variation of Data Retention in Phase-Change Memory Using Phase-Field Method
Kwon, Yongwoo
,
Kang, Dae-Hwan
,
Lee, Keun-Ho
,
Park, Young-Kwan
,
Chung, Chil-Hee
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 411 KB
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english, 2013
40
Electroluminescence Transition From Visible- to Ultraviolet-Dominant Mode in $\hbox{n-Mn}_{0.04}\hbox{Zn}_{0.96}\hbox{O/i-ZnGa}_{2}\hbox{O}_{4}\hbox{/} \hbox{n-GaN}$ Structure With Highly Ultraviolet Detection Performance
Zhou, Hai
,
Zhu, Yongdan
,
Wang, Hao
,
Chen, Xu
,
Fang, Guojia
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 262 KB
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english, 2013
41
Enhanced Current Drive of Double-Gate $\alpha$-IGZO Thin-Film Transistors
Chen, Tsang-Long
,
Huang, Kuan-Chang
,
Lin, Hsuan-Yi
,
Chou, C. H.
,
Lin, H. H.
,
Liu, C. W.
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 462 KB
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english, 2013
42
Comprehensive Understanding on the Role of Tunnel Oxide Top Nitridation for the Reliability of Nanoscale Flash Memory
Kim, Taehoon
,
Sarpatwari, Karthik
,
Koka, Sateesh
,
Wang, Hongmei
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 367 KB
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english, 2013
43
Determination of Ultimate Leakage Through Rutile $ \hbox{TiO}_{2}$ and Tetragonal $\hbox{ZrO}_{2}$ From Ab Initio Complex Band Calculations
Clima, Sergiu
,
Kaczer, B.
,
Govoreanu, B.
,
Popovici, M.
,
Swerts, J.
,
Verhulst, A. S.
,
Jurczak, M.
,
De Gendt, S.
,
Pourtois, G.
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 545 KB
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english, 2013
44
Investigation on Performance and Vacuum Package of MEMS Infrared Focal Plane Arrays
Ou, Yi
,
Li, Zhigang
,
Qu, Furong
,
Yang, Kai
,
Liu, Yu
,
Chen, Dapeng
,
Ye, Tianchun
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 507 KB
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english, 2013
45
Backside-Process-Induced Junction Leakage and Process Improvement of Cu TSV Based on Cu/Sn and BCB Hybrid Bonding
Chang, Yao-Jen
,
Ko, Cheng-Ta
,
Yu, Tsung-Han
,
Chiang, Cheng-Hao
,
Chen, Kuan-Neng
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 475 KB
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english, 2013
46
Characteristics and Mechanisms of Silicon-Oxide-Based Resistance Random Access Memory
Chang, Kuan-Chang
,
Tsai, Tsung-Ming
,
Chang, Ting-Chang
,
Wu, Hsing-Hua
,
Chen, Jung-Hui
,
Syu, Yong-En
,
Chang, Geng-Wei
,
Chu, Tian-Jian
,
Liu, Guan-Ru
,
Su, Yu-Ting
,
Chen, Min-Chen
,
Pan, Jhih-Hong
,
Chen, J
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 413 KB
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47
Changes to the Editorial Board
Chatterjee, Amitava
Journal:
IEEE Electron Device Letters
Year:
2013
File:
PDF, 19 KB
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2013
48
Table of contents
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 65 KB
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49
IEEE Electron Device Letters information for authors
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 112 KB
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50
Special Issue on GaN Electronic Devices
Journal:
IEEE Electron Device Letters
Year:
2013
File:
PDF, 410 KB
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2013
51
IEEE Electron Devices Society Meetings Calendar (As of 2/14/2013)
Journal:
IEEE Electron Device Letters
Year:
2013
File:
PDF, 59 KB
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2013
52
Table of contents
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 72 KB
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53
Changes to the Editorial Board
Chatterjee, Amitava
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
File:
PDF, 75 KB
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54
[Blank page - back cover]
Journal:
IEEE Electron Device Letters
Year:
2013
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PDF, 5 KB
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2013
55
Changes to the Editorial Board
Chatterjee, Amitava
Journal:
IEEE Electron Device Letters
Year:
2013
Language:
english
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PDF, 72 KB
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56
IEEE Journal of Electron Devices Society
Journal:
IEEE Electron Device Letters
Year:
2013
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PDF, 825 KB
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2013
57
IEEE Electron Device Letters publication information
Journal:
IEEE Electron Device Letters
Year:
2013
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english
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PDF, 149 KB
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