Experimental Investigation of Surface-Roughness-Limited...

IEEE Electron Device Letters 2011 / 02 Vol. 32; Iss. 2

Experimental Investigation of Surface-Roughness-Limited Mobility in Uniaxial Strained pMOSFETs

Chen, William P. N., Kuo, Jack J. Y., Su, Pin
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Volume:
32
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2010.2090126
Date:
February, 2011
File:
PDF, 347 KB
english, 2011
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