The effect of junction fringing fields on radiation-induced...

IEEE Transactions on Nuclear Science 1992 / Dec. Vol. 39; Iss. 6

The effect of junction fringing fields on radiation-induced leakage current in oxide isolation structures

Pershenkov, V.S., Chuikin, V.V.
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Volume:
39
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.211402
Date:
January, 1992
File:
PDF, 709 KB
english, 1992
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