Volume 39; Issue 6

IEEE Transactions on Nuclear Science

Volume 39; Issue 6

1

Improved nuclear reactor temperature control using diagonal recurrent neural networks

Ku, C.-C., Lee, K.Y., Edwards, R.M.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 834 KB

english, 1992

2

Low power SEU immune CMOS memory circuits

Liu, M.N., Whitaker, S.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 590 KB

english, 1992

3

An SEU resistant 256 K SOI SRAM

Hite, L.R., Lu, H., Houston, T.W., Hurta, D.S., Bailey, W.E.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 425 KB

english, 1992

4

Single event upset rates in space

Campbell, A., McDonald, P., Ray, K.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 756 KB

english, 1992

5

Interface-trap building rates in wet and dry oxides

Shaneyfelt, M.R., Schwank, J.R., Fleetwood, D.M., Winokur, P.S., Hughes, K.L., Hash, G.L., Connors, M.P.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 846 KB

english, 1992

6

Solutions to heavy ion induced avalanche burnout in power devices

Wrobel, T.F., Beutler, D.E.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 555 KB

english, 1992

7

Trends in the total-dose response of modern bipolar transistors

Nowlin, R.N., Enlow, E.W., Schrimpf, R.D., Combs, W.E.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 774 KB

english, 1992

8

Mechanism for single-event burnout of power MOSFETs and its characterization technique

Kuboyama, S., Matsuda, S., Kanno, T., Ishii, T.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 468 KB

english, 1992

9

1992 IEEE Nuclear and Space Radiation Effects Conference (NSREC '92)

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 386 KB

english, 1992

10

Electron and hole trapping in irradiated SIMOX, ZMR and BESOI buried oxides

Stahlbush, R.E., Campisi, G.J., McKitterick, J.B., Maszara, W.P., Roitman, P., Brown, G.A.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 1.11 MB

english, 1992

11

Characteristics of spontaneous electrical discharging of various insulators in space radiations

Frederickson, A.R., Holeman, E.G., Mullen, E.G.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 873 KB

english, 1992

12

New insights into radiation-induced oxide-trap charge through thermally-stimulated-current measurement and analysis (MOS capacitors)

Fleetwood, D.M., Miller, S.L., Reber, R.A., McWhorter, P.J., Winokur, P.S., Shaneyfelt, M.R., Schwank, J.R.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 1.30 MB

english, 1992

13

Generation lifetime, interface state density, active defect density and oxide resistivity measurements for SOI-MOSFETs and their radiation dependence

Kimpton, D., Kerr, J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 502 KB

english, 1992

14

Investigation of the oxygen-vacancy (A-center) defect complex profile in neutron irradiated high resistivity silicon junction particle detectors

Li, Z., Kraner, H.W., Verbitskaya, E., Eremin, V., Ivanov, A., Rattaggi, M., Rancoita, P.G., Rubinelli, F.A., Fonash, S.J., Dale, C., Marshall, P.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 704 KB

english, 1992

15

Total-dose radiation effects on sol-gel derived PZT thin films

Lee, S.C., Teowee, G., Schrimpf, R.D., Birnie, D.P., Uhlmann, D.R., Galloway, K.F.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 766 KB

english, 1992

16

Temperature dependence of single-event burnout in n-channel power MOSFETs (for space application)

Johnson, G.H., Schrimpf, R.D., Galloway, K.F., Koga, R.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 641 KB

english, 1992

17

CRRES dosimetry results and comparisons using the space radiation dosimeter and p-channel MOS dosimeters

Ray, K.P., Mullen, E.G., Stapor, W.J., Circle, R.R., McDonald, P.T.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 450 KB

english, 1992

18

Time-dependent radiation-induced charge effects in wafer-bonded SOI buried oxides

Boesch, H.E., Taylor, T.L.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 1.01 MB

english, 1992

19

The effect of junction fringing fields on radiation-induced leakage current in oxide isolation structures

Pershenkov, V.S., Chuikin, V.V.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 709 KB

english, 1992

20

Charge generation by heavy ions in power MOSFETs, burnout space predictions and dynamic SEB sensitivity

Stassinopoulos, E.G., Brucker, G.J., Calvel, P., Baiget, A., Peyrotte, C., Gaillard, R.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 982 KB

english, 1992

21

Radiation environment measurements on Shuttle missions using the CREAM experiment

Dyer, C.S., Sims, A.J., Truscott, P.R., Farren, J., Underwood, C.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 618 KB

english, 1992

22

Improvement of radiation hardness due to aging of fluorinated and chlorinated SiO/sub 2//Si MOS capacitors

Wang, X.-W., Wang, Y., Wang, D., Ma, T.-P.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 448 KB

english, 1992

23

Total dose hardness of bonded SOI wafers

McKitterick, J.B., Caviglia, A., Maszara, W.P.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 425 KB

english, 1992

24

Room temperature reactions involving silicon dangling bond centers and molecular hydrogen in amorphous SiO/sub 2/ thin films on silicon

Conley, J.F., Lenahan, P.M.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 680 KB

english, 1992

25

Observations of single-event upsets in non-hardened high-density SRAMs in Sun-synchronous orbit

Underwood, C.I., Ward, J.W., Dyer, C.S., Sims, A.J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 934 KB

english, 1992

26

Spatial and temporal dependence of SEU in a 64 K SRAM

Buchner, S., Kang, K., Stapor, W.J., Rivet, S.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 632 KB

english, 1992

27

Comparison of 1/f noise in irradiated power MOSFETs measured in the linear and saturation regions

Augier, P., Todsen, J.L., Zupac, D., Schrimpf, R.D., Galloway, K.F., Babcock, J.A.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 508 KB

english, 1992

28

Comparison of SEU rate prediction techniques

Petersen, E.L., Adams, J.H.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 382 KB

english, 1992

29

Ionizing radiation hardening of a CCD technology

Simone, A., Debusschere, I., Alaerts, A., Claeys, C.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 986 KB

english, 1992

30

The impact of ASIC devices on the SEU vulnerability of space-borne computers

Koga, R., Crain, W.R., Crawford, K.B., Hansel, S.J., Pinkerton, S.D., Tsubota, T.K.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 619 KB

english, 1992

31

Radiation response on Al-H, alkali-H and other H-related point defects in natural quartz crystals

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 813 KB

english, 1992

32

LQG/LTR robust control of nuclear reactors with improved temperature performance

Ben-Abdennour, A., Edwards, R.M., Lee, K.Y.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 741 KB

english, 1992

33

A verified proton induced latch-up in space (CMOS SRAM)

Adams, L., Daly, E.J., Harboe-Sorensen, R., Nickson, R., Haines, J., Schafer, W., Conrad, M., Griech, H., Merkel, J., Schwall, T., Henneck, R.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 340 KB

english, 1992

34

Electron spin resonance study of radiation-induced points defects in nitrided and reoxidized nitrided oxides

Yount, J.T., Lenahan, P.M., Dunn, G.J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 823 KB

english, 1992

35

Ionizing radiation damage near CMOS transistor channel edges

Balasinski, A., Ma, T.P.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 514 KB

english, 1992

36

The effect of the March 1991 storm on accumulated dose for selected satellite orbits: CRRES dose models

Gussenhoven, M.S., Mullen, E.G., Sperry, M., Kerns, K.J., Blake, J.B.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 710 KB

english, 1992

37

Applicability of LET to single events in microelectronic structures

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 752 KB

english, 1992

38

Silicon carbide JFET radiation response

McGarrity, J.M., McLean, F.B., DeLancey, W.M., Palmour, J., Carter, C., Edmond, J., Oakley, R.E.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 773 KB

english, 1992

39

Spectroscopic analysis of proton-induced fluorescence from yttrium and gadolinium oxysulfide phosphors

Hollerman, W.A., Fisher, J.H., Shelby, G.A., Holland, L.R., Jenkins, G.M.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 310 KB

english, 1992

40

Dose-rate-independent total dose failure in 54F10 bipolar logic circuits

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 312 KB

english, 1992

41

Quasi-static model of outer zone electrons

Brautigam, D.H., Gussenhoven, M.S., Mullen, E.G.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 619 KB

english, 1992

42

Survivability of high-T/sub c/ microwave devices in space radiation environments

Jackson, E.M., Weaver, B.D., Maisch, W.G., Summers, G.P.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 418 KB

english, 1992

43

CRRES microelectronic test chip orbital data. II

Soli, G.A., Blaes, B.R., Buehler, M.G., Ray, K., Lin, Y.-S.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 468 KB

english, 1992

44

A comparison between /sup 60/Co ground tests and CRRES space flight data

Ray, K.P., Mullen, E.G., Bradley, T.E., Zimmerman, D.M., Duff, E.A.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 736 KB

english, 1992

45

Low dose rate space estimates for integrated circuits using real time measurements and linear system theory

Stapor, W.J., Meyers, J.P., Kinnison, J.D., Carkhuff, B.G.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 602 KB

english, 1992

46

The time-dependence of post-irradiation interface trap build-up in deuterium-annealed oxides (n-MOSFET)

Saks, N.S., Rendell, R.W.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 1.02 MB

english, 1992

47

A model for radiation induced edge leakage in bulk silicon NMOS transistors

Jacunski, M.D., Peckerar, M.C.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 449 KB

english, 1992

48

Fluences and spectra of accelerator generated fast neutrons

Kegel, G.H.R., Bertone, P.F., Case, D.L., DeSimone, D.J., Jen, C.K.C., Narayan, C., O'Connor, M., Staples, P.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 640 KB

english, 1992

49

Charge transport and trapping in HgCdTe MIS devices

Moriwaki, M.M., Srour, J.R., Strong, R.L.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 848 KB

english, 1992

50

Picosecond charge-collection dynamics in GaAs MESFETs (for space application)

McMorrow, D., Melinger, J.S., Knudson, A.R., Campbell, A.B., Weatherford, T., Tran, L.H., Curtice, W.R.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 767 KB

english, 1992

51

Interface-state generation under radiation and high-field stressing in reoxidized nitrided oxide MOS capacitors

Bhat, N., Vasi, J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 502 KB

english, 1992

52

An observation of proton-induced latchup (in CMOS microprocessor)

Nichols, D.K., Coss, J.R., Watson, R.K., Schwartz, H.R., Pease, R.L.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 271 KB

english, 1992

53

Effect of radiation-induced interface traps on 1/f noise in MOSFET's

Tsai, M.-H., Ma, T.P.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 591 KB

english, 1992

54

Fast neutron-induced changes in net impurity concentration of high-resistivity silicon

Tsevybak, I., Bugg, W., Harvey, J.A., Walter, J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 856 KB

english, 1992

55

Space radiation effects on optoelectronic materials and components for a 1300 nm fiber optic data bus

Marshall, P.W., Dale, C.J., Burke, E.A.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 753 KB

english, 1992

56

In situ microwave ionized air chemistry measurements

Smith, R.S., Bushell, M., Fleetwood, R., Merkel, G., Smith, M.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 523 KB

english, 1992

57

The radiation field in and around Hadron collider detectors

Stevenson, G.R., Fasso, A., Ferrari, A., Sala, P.R.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 683 KB

english, 1992

58

A comparison of charge collection effects between GaAs MESFETs and III-V HFETs

Hughlock, B., Johnston, A., Williams, T., Harrang, J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 452 KB

english, 1992

59

Bremsstrahlung risetime shortening by diode geometry reconfiguration

Bushell, M., Fleetwood, R., Judy, D., Merkel, G., Smith, M., Nguyen, K., Weidenheimer, D.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 569 KB

english, 1992

60

Initial hydrogen ion profiles during interface trap formation in MOS devices

Brown, D.B., Saks, N.S.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 750 KB

english, 1992

61

An intense large-volume uniform source of bremsstrahlung for pulsed gamma ray simulation

Sanford, T.W.L., Mock, R.C.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 802 KB

english, 1992

62

Circuit reliability of memory cells with SEU protection (for space application)

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 511 KB

english, 1992

63

A flow-through detector for nano-Curie activities encountered in HPLC analysis of PET tracer metabolites

Nickles, R.J., de Jesus, O.T., Solin, O., Haaparanta-Solin, M.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 692 KB

english, 1992

64

Laser simulation of single-particle effects

Gossett, C., Hughlock, B.W., Johnston, A.H.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 528 KB

english, 1992

65

Radiation effects in Ga/sub 0.47/In/sub 0.53/As devices

Walters, R.J., Shaw, G.J., Summers, G.P., Burke, E.A., Messenger, S.R.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 674 KB

english, 1992

66

Rate prediction for single event effects-a critique

Petersen, E.L., Pickel, J.C., Adams, J.H., Smith, E.C.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 2.32 MB

english, 1992

67

Long-term annealing of a radiation-hardened 1.0 micron bulk CMOS process

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 691 KB

english, 1992

68

Observation of radiation induced changes in stress and electrical properties in MOS devices

Shaw, D.C., Lowry, L., MacWilliams, K.P., Barnes, C.E.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 591 KB

english, 1992

69

Charge collection at large angles of incidence (CMOS SRAM)

McNulty, P.J., Beauvais, W.J., Reed, R.A., Roth, D.R., Stassinopoulos, E.G., Brucker, G.J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 673 KB

english, 1992

70

Measurement of X-ray spectrum using a small size CdTe multichannel detector

Tsutsui, H., Ohtsuchi, T., Ohmori, K., Baba, S.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 402 KB

english, 1992

71

Cobalt60 and proton radiation effects on large format, 2-D, CCD arrays for an Earth imaging application

Hopkinson, G.R.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 923 KB

english, 1992

72

Identification of an unexpected space radiation hazard

Blake, J.B., Gussenhoven, M.S., Mullen, E.G., Fillius, R.W.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 313 KB

english, 1992

73

The relationship of proton and heavy ion upset thresholds

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 483 KB

english, 1992

74

Improving the radiation burn-out susceptibility of N-channel power MOSFETs

Keshavarz, A.A., Fischer, T.A.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 310 KB

english, 1992

75

Evidence for a deep electron trap and charge compensation in separation by implanted oxygen oxides

Conley, J.F., Lenahan, P.M., Roitman, P.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 693 KB

english, 1992

76

Spacecraft problems in association with episodes of intense solar activity and related terrestrial phenomena during March 1991

Shea, M.S., Smart, D.F., Allen, J.H., Wilkinson, D.C.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 541 KB

english, 1992

77

Infrared mapping of transient electromagnetic fields radiated by high power microwave pulsed sources

Norgard, I.D., Sega, R.M., Harrison, M.G., Pohle, N.H.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 1.86 MB

english, 1992

78

Dipole models for the far-field representation of EMP simulators with application to estimates of human RF exposure

Williams, J.W., Hadlock, D.E., Viverito, V.J., Patrick, E.L.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 1.04 MB

english, 1992

79

Modeling the time-dependent transient radiation response of semiconductor junctions

Wunsch, T.F., Axness, C.L.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 795 KB

english, 1992

80

Ionizing radiation effects on phosphorus implanted N/sup +/ poly gate MOS capacitors with thin gate oxides

Kelleher, A., Heyns, M., Wulf, F., Lane, W.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 772 KB

english, 1992

81

Evolution of capture cross-section of radiation-induced interface traps in MOSFETs as studied by a rapid charge pumping technique

Chen, W., Balasinski, A., Ma, T.-P.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 498 KB

english, 1992

82

Photoconduction measurements of the charge trapping and transport in bond-and-etch-back buried oxides

Pennise, C.A., Boesch, H.E.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 702 KB

english, 1992

83

Gate size dependence of the radiation-produced changes in threshold voltage, mobility, and interface state density in bulk CMOS

Scarpulla, J., Amram, A.L., Gin, V.W., Morse, T.C., Nakamura, K.T.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 820 KB

english, 1992

84

Electronic component preview of low dose rate behavior (HCMOS devices)

David, J.P., Barillot, C.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 494 KB

english, 1992

85

Study of electrically active lattice defects in Cf-252 and proton irradiated silicon diodes

Trauwaert, M.-A., Vanhellemont, J., Simoen, E., Claeys, C., Johlander, B., Adams, L., Clauws, P.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 587 KB

english, 1992

86

Laser confirmation of SEU experiments in GaAs MESFET combinational logic (for space application)

Schneiderwind, R., Krening, D., Buchner, S., Kang, K., Weatherford, T.R.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 557 KB

english, 1992

87

The effects of 1 kW class arcjet thruster plumes on spacecraft charging and spacecraft thermal control materials

Bogorad, A., Lichtin, D.A., Bowman, C., Armenti, J., Pencil, E., Sarmiento, C.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 628 KB

english, 1992

88

Double upsets from glancing collisions: a simple model verified with flight data (SRAM)

Smith, E.C., Shoga, M.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 552 KB

english, 1992

89

The effects of conducting breaks on electrostatic discharges (ESDs) on optical solar reflector (OSR) panels

Bogorad, A., Bowman, C., Seehra, S., Armenti, J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 454 KB

english, 1992

90

Latent interface-trap buildup and its implications for hardness assurance (MOS transistors)

Schwank, J.R., Fleetwood, D.M., Shaneyfelt, M.R., Winokur, P.S., Axness, C.L., Riewe, L.C.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 1008 KB

english, 1992

91

Effect of new cross section evaluations on neutron spectrum determination

Griffin, P.J., Kelly, J.G., Luera, T.F., VanDenburg, J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 782 KB

english, 1992

92

Field dependent charge trapping effects in SIMOX and buried oxides at very high dose

Flament, O., Herve, D., Musseau, O., Bonnel, P., Raffaelli, M., Leray, J.L., Margail, J., Giffard, B., Auberton-Herve, A.J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 536 KB

english, 1992

93

Qualification of a new facility for neutron hardness assurance testing of electronics (for military systems)

Sheehan, P.S., Saxey, B.L.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 844 KB

english, 1992

94

Proton-induced SEU, dose effects, and LEO performance predictions for R3000 microprocessors

Shaeffer, D.L., Kimbrough, J.R., Wilburn, J.W., Denton, S.M., Kaschmitter, J.L., Colella, N.J., Coakley, P.G., Casteneda, C.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 753 KB

english, 1992

95

Heavy ion induced single hard errors on submicronic memories (for space application)

Dufour, C., Garnier, P., Carriere, T., Beaucour, J., Ecoffet, R., Labrunee, M.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 460 KB

english, 1992

96

X-ray lithography effects on MOS oxides

Lelis, A.J., Oldham, T.J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 747 KB

english, 1992

97

Qualifying commercial ICs for space total-dose environments

Sexton, F.W., Fleetwood, D.M., Aldridge, C.C., Garrett, G., Pelletier, J.C., Gaona, J.I.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 720 KB

english, 1992

98

Study of device parameters for analog IC design in a 1.2 mu m CMOS-SOI technology after 10 Mrad (for hadron colliders)

Faccio, F., Heijne, E.H.M., Jarron, P., Glaser, M., Rossi, G., Avrillon, S., Borel, G.

Journal:

IEEE Transactions on Nuclear Science

Year:

1992

Language:

english

File:

PDF, 652 KB

english, 1992