Functional Broadside Tests for Multistep Defect Diagnosis

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 2014 / 9 Vol. 33; Iss. 9

Functional Broadside Tests for Multistep Defect Diagnosis

Pomeranz, Irith
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Volume:
33
Language:
english
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/tcad.2014.2331559
Date:
September, 2014
File:
PDF, 889 KB
english, 2014
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