Improved ON-State Reliability of Atom Switch Using Alloy Electrodes
Tada, Munehiro, Sakamoto, Toshitsugu, Banno, Naoki, Okamoto, Koichiro, Iguchi, Noriyuki, Hada, Hiromitsu, Miyamura, MakotoVolume:
60
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2013.2275188
Date:
October, 2013
File:
PDF, 6.73 MB
english, 2013