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General Framework for Single Event Effects Rate Prediction in Microelectronics
Weller, Robert A., Reed, Robert A., Warren, Kevin M., Mendenhall, Marcus H., Sierawski, Brian D., Schrimpf, Ronald D., Massengill, Lloyd W.Volume:
56
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2009.2033916
Date:
December, 2009
File:
PDF, 357 KB
english, 2009