A Program-Erasable...

IEEE Electron Device Letters 2007 / 10 Vol. 28; Iss. 10

A Program-Erasable High-$\kappa$$\hbox{Hf}_{0.3}{\hbox{N}}_{0.2}{\hbox{O}}_{0.5}$ MIS Capacitor With Good Retention

Yang, H. J., Chin, Albert, Chen, W. J., Cheng, C. F., Huang, W. L., Hsieh, I. J., McAlister, S. P.
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Volume:
28
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2007.905375
Date:
October, 2007
File:
PDF, 251 KB
english, 2007
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