Qualitative doping area characterization of SONOS...

Qualitative doping area characterization of SONOS transistor utilizing scanning capacitance microscopy (SCM) and scanning spread resistance microscopy (SSRM)

Jinhee Heo, Deoksu Kim, Chung woo Kim, Ilsub Chung
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Volume:
124-125
Year:
2005
Language:
english
Pages:
4
DOI:
10.1016/j.mseb.2005.08.097
File:
PDF, 846 KB
english, 2005
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