Radiation Dose Effects in Trigate SOI MOS Transistors

IEEE Transactions on Nuclear Science 2006 / 12 Vol. 53; Iss. 6

Radiation Dose Effects in Trigate SOI MOS Transistors

Colinge, J. P., Orozco, A., Rudee, J., Xiong, Weize, Cleavelin, C. Rinn, Schulz, T., Schrfer, K., Knoblinger, G., Patruno, P.
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Volume:
53
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2006.885841
Date:
December, 2006
File:
PDF, 1.27 MB
english, 2006
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