Profiling of traps in SiO2/Al2O3 gate stack by the charge...

Profiling of traps in SiO2/Al2O3 gate stack by the charge pumping technique

Isodiana Crupi, Robin Degraeve, Bogdan Govoreanu, David P. Brunco, Philippe Roussel, Jan Van Houdt
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
9
Year:
2006
Language:
english
Pages:
3
DOI:
10.1016/j.mssp.2006.10.005
File:
PDF, 132 KB
english, 2006
Conversion to is in progress
Conversion to is failed